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Reduce Leakage Power with Blaze MO
Blaze MO Reduced Microprocessor Core Leakage Power by 25%, Leakage Variability by 50%.

Reduce leakage power by 20% or more. Cut leakage variability in half.

You may believe that you are already doing everything possible to reduce leakage power by using:
multi-Vt libraries, header/footer sleep switches, voltage islands, transistor body biasing.

We can help you to reduce leakage power even more. Blaze MO offers the following benefits:

  • Reduce leakage power by 20% or more on digital CMOS designs
  • Cut leakage variability in half
  • No performance hit
  • No schedule hit
  • Guaranteed timing closure
  • Can be used on existing or in-process designs
  • No change to architecture, libraries, logic design, or layout
  • Fully compatible with, and additive to, the leakage reduction techniques mentioned above
  • Plugs into any existing design flow
  • Only one mask (poly) is affected
  • Supported by major foundries
Please contact us for more information on how you can reduce leakage power on your designs today.



Here are some customer-written articles on how they are reducing leakage power with Blaze MO.

Article: Leakage Power Optimization for a Wireless Comms SoC, EDA Tech Forum 12/06
Article: Leakage reduction in SOCs using gate-length biasing, Solid State Technology 9/06
Article: Leakage Power Reduction in a Mobile Baseband Processor, Chip Design 7/17/06


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